(주)다나기술

신뢰성 시험장비(SET GmbH)

시스템 신뢰성 시험장비(SET GmbH)

당사는 독일소재 SET사와 전략적 파트너로 LSET의 제품 및 시스템을 국내 보급및 기술지원을 담당하고 있습니다.
SET GmbH사는 semiconductor test systems 및 HiL and functional test systems을 개발 공급하고 있으며,
항공, 반도체, 자동차에 제품과 기술을 제공하고 있습니다.
당사는 SET GmbH사의 기술적인 경험을 이용하여 국내 환경에 맞는 최적의 시스템을 구현하고자 노력하고 있습니다.



Semiconductor test systems - 신뢰성 시험장비

The systems increase measurement quality & throughput
while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.

HTRB Test System
HTGB Test System
H3TRB Test System

  • Fewer climate chambers due to high number of DUTs tested simultaneously
  • No test interruptions due to defective DUTs
  • High throughput for each system
  • Several different tests possible within one test run
  • Complete logging of all devices under test during the complete test phase
  • Fully automated test process
  • Automated test continuation according to characterization
  • Freely programmable test system based on National Instruments' COTS platform
  • Integrated safety system

IOL Test Systems - 신뢰성 시험장비

The IOL & Power-Cycling systems incread measurement quality & throughput
while simultaneously reducing the Total Cost of Test (TCoT) of an open platform.
We focus on compplete monitoring and precise specification of all parameter
for each device under test.

  • 100% monitoring of devices under test
  • High throughput due to compact design and active cooling
  • Fully automated test procedure
  • Automated test continuation according to characterization
  • Modular design allows for easy expansion
  • Freely programmable test system based on National Instruments' COTS platform
  • High-precision timing via FPGA technology
  • Adaptable for various purposes and number of devices under test

HTOL test systems - 신뢰성 시험장비

Our IOL & Power-Cycling systems increase measurement quality &
throughput while simultaneously reducing the Total Cost of Test(TCoT)
of an open platform. We focus on complete monitoring and precise
temperature control for each device under test.

  • Complete logging of all devices under test during the complete test phase
  • Exact temperature control of each test object on its semiconductor structure
  • RF load of the samples possible
  • High throughput for each system
  • Fully automated test procedure
  • Automated test continuation according to characterization
  • Freely programmable test system based on National Instruments' COTS platform
  • No test interruptions due to defective DUTs
  • Integrated safety system

HIL & Functional Test Systems

> From ARINC to ZigBee-with PXI and cRIO
We offer solutions for more than 2000 types of signals

> The superme discipline - signal conditioning
Our standardized plattforms with more than 130 modules provide a path for evey signal

> Active Breakout Panel-aBOP
Our modular aBOP uses a signal martrix,and allow every system to test itself and simulate faults

> Software-our solution's brain and face
Based on National Instrument's tools and our reliable
and tested libraries, our architects customize every system to your needs.

> Power Control Unit with intergrate saftey feature
Our modular DDU supplies your system and protects the operator

당사는 데이터 수집 분석 및 계측통합시스템 전문회사 입니다. 우수한 성능과 가성비 높은 제품을 국내 보급함과 동시에 사용자 환경에 최적화된 계측통합 시스템을 개발 공급하고 있으며 전압, 전류, 온도, 압력, 진동, 소음 등 다양한 형태의 신호측정과, 항공우주, 반도체, 기초과학, 무기체계, 양산설비 분야에 최적의 시스템을 공급하고 있습니다.
DANA is committed to providing the highest quality DAQ hardware, software and System Integration service, enabling engineers and scientist South Korea. Our customers are researchers/developers, system
integrators and OEMs. DANA collects state-of-the-art products for the Aerospace, Energy, semiconductor, Basic Science, Defense and Manufacture industries allowing our customers to build smart systems that
are reliable, flexible and cost performance solutions

  • 031-714-9715
  • information@danatec.co.kr

CONTACT

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